The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Jan. 30, 2007
Matthew C. Malkin, Seattle, WA (US);
Justin D. Kearns, Seattle, WA (US);
Matthew C. Malkin, Seattle, WA (US);
Justin D. Kearns, Seattle, WA (US);
Theo Boeing Company, Chicago, IL (US);
Abstract
Structural analysis systems and methods are disclosed. One embodiment provides a method for analyzing a structure includes receiving damage image data; converting the received image data into analysis data in an analyzable format; performing a structural analysis on the analysis data; and outputting the results of the structural analysis. The system includes a computer or other processing device that is capable of analyzing a structure. The system receives damage image data; converts the received image data into analysis data in an analyzable format; performs a structural analysis on the analysis data; and outputs the results of the structural analysis.