The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Jul. 27, 2005
Jin-woo Yu, Suwon-si, KR;
Young-ki Byun, Yongin-si, KR;
Jin-woo Yu, Suwon-si, KR;
Young-ki Byun, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
A method for correctly determining optimum recording power through detecting whether a radio frequency (RF) top channel signal is correct, including determining a certain location for performing optimum power control (OPC) by checking a counter area in a power calibration area (PCA) in an optical recording medium, and recording an eight to fourteen modulation signal (EFM) in a test area in the PCA, performing analog/digital sampling with respect to an RF top channel signal and an RF bottom channel signal which are generated while reading test data repeatedly recorded in the PCA in regular sequence, and checking a noise level of the sampled RF top channel signal, and when the noise level of the RF top channel signal is greater than a preset reference value, determining that an error has occurred in detecting the optimum recording power to therefore abandon a certain area in the PCA wherein the OPC is being performed, and re-performing the OPC in a new area. Accordingly, by detecting whether the top channel signal is correct and re-performing the OPC when the top channel signal has an error, the optimum recording power can be more correctly determined.