The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2008

Filed:

Sep. 26, 2002
Applicants:

Naoki Hagai, Komaki, JP;

Masashi Kuno, Ohbu, JP;

Masaki Kondo, Toyoake, JP;

Masashi Ueda, Nagoya, JP;

Masahiro Nishihara, Nagoya, JP;

Inventors:

Naoki Hagai, Komaki, JP;

Masashi Kuno, Ohbu, JP;

Masaki Kondo, Toyoake, JP;

Masashi Ueda, Nagoya, JP;

Masahiro Nishihara, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An error utilization factor line, indicative of a relationship between the amount of the error utilization factor K and input data for a present pixel, is determined dependently on characteristics of the image, on the value of the threshold, on the size of the distribution matrix, or on the condition of the recording operation. The amount of the error utilization factor K is determined dependently on the input data of the present pixel and based on the error utilization factor line. The correction amount F, collected from the already-processed nearby pixel, is multiplied by the error utilization factor K, before being added to the input data of the present pixel for the halftone process.


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