The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Apr. 06, 2006
Frank Vollmer, Boston, MA (US);
Peer Fischer, Belmont, MA (US);
Frank Vollmer, Boston, MA (US);
Peer Fischer, Belmont, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
A method and apparatus for performing refractive index, birefringence and optical activity measurements of a material such as a solid, liquid, gas or thin film. The apparatus has an optical ring-resonator with a closed optical path that constitutes a cavity. A sample is introduced into the optical path of the resonator such that the light in the resonator is transmitted through the sample and relative and/or absolute shifts of the resonance frequencies or changes of the characteristics of the transmission spectrum are observed. A change in the transfer characteristics of the resonant ring, such as a shift of the resonance frequency, is related to a sample's refractive index (refractive indices) and/or change thereof. A reflecting surface may be introduced in a ring resonator. The reflecting surface can be raster-scanned for the purpose of height-profiling surface features.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile