The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Nov. 16, 2006
Trent Ridder, Woodbridge, VA (US);
Ben Ver Steeg, Redlands, CA (US);
John D. Maynard, Albuquerque, NM (US);
Zachary Benz, Albuquerque, NM (US);
Trent Ridder, Woodbridge, VA (US);
Ben ver Steeg, Redlands, CA (US);
John D. Maynard, Albuquerque, NM (US);
Zachary Benz, Albuquerque, NM (US);
TruTouch Technologies, Inc., Albuquerque, NM (US);
Abstract
The present invention provides methods and apparatuses that can improve measurement accuracy in interferometers. The invention provides methods for determining digital compensation filters that measure a frequency response or responses to be compensated, and then determining a filter target response from the inverse of the frequency response or responses. A digital compensation filter can be determined from the filter target response using a discrete sum of cosines with a phase argument. The invention also allows other desired filter responses to be integrated into the filter target response before determining the digital compensation filter.