The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Sep. 27, 2006
Frank Arndt, Berlin, DE;
Jan Grahmann, Berlin, DE;
Jens-christian Holst, Berlin, DE;
Jens Dahl Jensen, Berlin, DE;
Ursus Krüger, Berlin, DE;
Hendrik Rönsch, Berlin, DE;
Arno Steckenborn, Berlin, DE;
Frank Arndt, Berlin, DE;
Jan Grahmann, Berlin, DE;
Jens-Christian Holst, Berlin, DE;
Jens Dahl Jensen, Berlin, DE;
Ursus Krüger, Berlin, DE;
Hendrik Rönsch, Berlin, DE;
Arno Steckenborn, Berlin, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention relates to a method for verification of particles, in particular of nanoparticles (), in which a sensor area () is made available for this purpose, on which the particles can accumulate. The invention also relates to a sensor arrangement having a sensor area () which is suitable for carrying out the method mentioned. The invention provides for a plurality of sensor areas () to be arranged, on which particles which each have different characteristics can accumulate. For example, this makes it possible to classify nanoparticles () of different size, thus advantageously allowing a statement to be made on the size distribution of the nanoparticles () in a nanopowder.