The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Oct. 24, 2007
Kurt L. Feigl, Madison, WI (US);
Clifford H. Thurber, Madison, WI (US);
Kurt L. Feigl, Madison, WI (US);
Clifford H. Thurber, Madison, WI (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
A method and apparatus have been developed to model wrapped phase data directly. An average statistical cost measures the misfit between the observed phase value modeled phase value. A set of acceptable values for the parameters in a parametric expression characterizing the wrapped phase is found by searching for an average statistical cost below a threshold. In the context of interferometry, the parameter values can then be used to determine the impact of a geophysical event on a geographic area. In the context of a global navigation satellite system (GNSS), such as the Global Positioning System (GPS), the values can be used to determine the position of a GNSS receiver.