The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Feb. 21, 2006
Applicants:
Juergen Riedmann, Obersulm-Eschenau, DE;
Werner Knebel, Kronau, DE;
Lioba Kuschel, Mannheim, DE;
Inventors:
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V 9/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens includes varying an intensity distribution of excitation light by varying an excitation/illumination volume over a plurality of mutually independent measurements. A determination is made as to whether observed time constants change between the measurements. The existence of a dark state is inferred where the observed time constants are unchanged between the measurements.