The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2008

Filed:

Jan. 18, 2005
Applicant:

Katsuyuki Kinoshita, Hamamatsu, JP;

Inventor:

Katsuyuki Kinoshita, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 31/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A streak apparatus includes: a vacuum containerhaving an electron beam sourceprovided on one end side to emit an electron beam E and an output sectionprovided on the other end side to convert the electron beam into an image; an accelerating sectionprovided in the vacuum container to accelerate the electron beam; an irradiation optical systemfor collecting and applying to-be-measured light R to the electron beam accelerated by the accelerating section; and a sweep sectionprovided between the accelerating section and the output section to sweep the electron beam having interacted with the to-be-measured light in a direction approximately perpendicular to the direction of a displacement of the electron beam generated through the interaction. This allows the streak apparatus to have a higher temporal resolution.


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