The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2008

Filed:

Jun. 12, 2003
Applicants:

Etienne Fesquet, Valence, FR;

Hicham El Bernoussi, Paris, FR;

Cyrille Prudhomme, Champigny sur Marne, FR;

Inventors:

Etienne Fesquet, Valence, FR;

Hicham El Bernoussi, Paris, FR;

Cyrille Prudhomme, Champigny sur Marne, FR;

Assignee:

Solystic, Gentilly Cedex, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The method of detecting single postal items and multiple overlapping postal items in a postal sorting installation consists in analyzing images () representing postal items () viewed from in front, and in applying to each image an outline-extracting process () in order to recognize items () having an outline () of substantially constant height as being single items. In this method, the reliability with which single items is detected is improved, and the digital image used for analysis purposes can be the digital image which is also used for optical character recognition processing in the postal sorting installation.


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