The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Feb. 27, 2004
Annalisa Bonfiglio, Cagliari, IT;
Sergio Sanna, Legal Representative, Guspini, IT;
Giulia Lampis, Legal Representative, Guspini, IT;
Marco Federico Sanna, Legal Representative, Guspini, IT;
Giulia Sanna, Legal Representative, Villorba, IT;
Fulvia Mameli, Cagliari, IT;
Annalisa Bonfiglio, Cagliari, IT;
Sergio Sanna, legal representative, Guspini, IT;
Giulia Lampis, legal representative, Guspini, IT;
Marco Federico Sanna, legal representative, Guspini, IT;
Giulia Sanna, legal representative, Villorba, IT;
Fulvia Mameli, Cagliari, IT;
Abstract
A method for the manufacture of a thin-film field-effect device comprising, on a mechanical support layer, source and drain electrodes (S, D), a layer of semiconductor material (SC) for the formation of a conduction channel, and a gate electrode (G) insulated from the channel region, is described. The method provides for the use of a mechanical support layer in the form of a film (INS) of flexible, electrically insulating material; for the formation of the source and drain electrodes (S, D) in accordance with a predetermined configuration on a first surface of the insulating film; and for the formation of the gate electrode (G) on the opposite surface of the insulating film (INS) in accordance with a predetermined configuration complementary with the configuration of the source and drain electrodes (S, D), that configuration being achieved by a lithographic technique by selective masking determined by the source and drain electrodes (S, D) which are formed on the first surface of the film (INS).