The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
May. 03, 2005
Nobuko Yamamoto, Kanagawa, JP;
Tadashi Okamoto, Kanagawa, JP;
Shinya Tanaka, Tokyo, JP;
Tomohiro Suzuki, Kanagawa, JP;
Nobuko Yamamoto, Kanagawa, JP;
Tadashi Okamoto, Kanagawa, JP;
Shinya Tanaka, Tokyo, JP;
Tomohiro Suzuki, Kanagawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method for screening presence or absence of a variation in a region of a nucleic acid which comprises the steps of (a) preparing a sample containing a test nucleic acid corresponding to the region, (b) preparing a probe having a base sequence fully complementary to a normal sequence of the region, and a plurality of probes each having at least one base not complementary to the normal sequence, (c) fixing the probes in separate regions on a surface of a substrate to prepare a DNA array substrate, (d) reacting the test nucleic acid with the probes on the DNA array substrate, (e) measuring signals in each region where the signals are originated from respective hybrids formed between the test nucleic acid and one of the probes, and (f) calling variation in the test nucleic acid using a pattern of total signals of all regions.