The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7445377 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 04, 2008

Filed:

Mar. 11, 2004
Applicants:

Peng Lee, Oxford, MS (US);

Kevin J Seddon, Oxford, MS (US);

Inventors:

Peng Lee, Oxford, MS (US);

Kevin J Seddon, Oxford, MS (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential components, a pitched roof and basement of a residential building and the electrical system of a residential building.


Find Patent Forward Citations

Lee, Peng. (2008). Nondestructive residential inspection method and apparatus (U.S. Patent No. 7445377). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7445377

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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