The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7445335 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 04, 2008

Filed:

Jan. 20, 2006
Applicants:

Wei Su, Sunnyvale, CA (US);

Yan Zhou, Pleasanton, CA (US);

Qing Chun Zhao, Sunnyvale, CA (US);

Inventors:

Wei Su, Sunnyvale, CA (US);

Yan Zhou, Pleasanton, CA (US);

Qing Chun Zhao, Sunnyvale, CA (US);

Assignee:

Clarity Medical Systems, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sequential wavefront sensor comprises a light beam scanning module, a sub-wavefront focusing lens, a detector with more than one photosensitive area and a processor for calculating the sequentially obtained centroids of a number focused light spots from the sub-wavefronts to determine the aberration of the input wavefront. A sequential wavefront sensing method comprises the steps of; sequentially projecting a number of sub-wavefronts onto a sub-wavefront focusing lens and a detector with more than one photosensitive areas, calculating the centroid of the focused light spot from each sub-wavefront, and processing the centroid information to determine the aberration of the wavefront. In particular, a method for auto-focusing and/or auto-astigmatism-correction comprises the steps of sequentially projecting a number of sub-wavefronts around an annular ring of a wavefront to a sub-wavefront focusing lens and a detector, calculating the centroid of focused light spot from each sub-wavefront to figure out the centroid trace and hence the defocus and/or astigmatism, adjusting the focus and/or astigmatism of the optical imaging system before the wavefront sensor so that the measured defocus and/or astigmatism is minimized.


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Su, Wei. (2008). Sequential wavefront sensor (U.S. Patent No. 7445335). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7445335

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