The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Dec. 06, 2005
Material failure prediction/stress/strain detection method and system using deformation luminescence
Applicant:
Geoffrey Woo, Rancho Palos Verdes, CA (US);
Inventor:
Geoffrey Woo, Rancho Palos Verdes, CA (US);
Assignee:
Other;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus are provided for detecting strain, stress, fatigue and incipient failure in materials. A detector (e.g., a photomultiplier tube) is used to detect photonic emissions from a material under test. Data based on the detected photonic emissions is displayed in real time so as to enable real time analysis of the data in determining strain, stress, fatigue and/or incipient failure.