The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Sep. 22, 2005
Friedrich B. Prinz, Woodside, CA (US);
YE Tao, Stanford, CA (US);
Rainer J. Fasching, Mill Valley, CA (US);
Ralph S. Greco, Stanford, CA (US);
Kyle Hammerick, Mountain View, CA (US);
Robert Lane Smith, Palo Alto, CA (US);
Friedrich B. Prinz, Woodside, CA (US);
Ye Tao, Stanford, CA (US);
Rainer J. Fasching, Mill Valley, CA (US);
Ralph S. Greco, Stanford, CA (US);
Kyle Hammerick, Mountain View, CA (US);
Robert Lane Smith, Palo Alto, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Sensors and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided. The sensors include a cantilever and one or more probes, each of which has an electrode at its tip. The tips of the probes are sharp, with a radius of curvature of less than about 50 nm. In addition, the probes have a high aspect ratio of more than about 19:1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.