The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Feb. 16, 2006
Gary R. Morrison, Austin, TX (US);
Jose A. Lyon, Austin, TX (US);
William C. Moyer, Dripping Springs, TX (US);
Anthony M. Reipold, Austin, TX (US);
Gary R. Morrison, Austin, TX (US);
Jose A. Lyon, Austin, TX (US);
William C. Moyer, Dripping Springs, TX (US);
Anthony M. Reipold, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method for testing at least one logic block of a processor includes, during execution of a user application by the processor, the processor generating a stop and test indicator. In response to the generation of the stop and test indicator, stopping the execution of the user application and, if necessary, saving a state of the at least one logic block of the processor. The method further includes applying a test stimulus for testing the at least one logic block of the processor. The test stimulus may be shifted into scan chains so as to perform scan testing of the processor during normal operation, such as during execution of a user application.