The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Jun. 13, 2006
Mark A. Proett, Missouri City, TX (US);
Bruce H. Storm, Jr., Houston, TX (US);
Mark A. Proett, Missouri City, TX (US);
Bruce H. Storm, Jr., Houston, TX (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
A method and system for statistical pressure gradient and fluid contact analysis. The method and system include planning for a pressure gradient test by using expected parameters and statistical expected error analysis to set the actual pressure gradient test parameters within an acceptable range of reliability. The method and system may account for one or more fluids within a formation and may also perform fluid contact analysis as part of planning the overall pressure gradient test. The method and system also include performing the planned pressure gradient test and comparing the measured data and statistical measured data error analysis with statistical expected error analysis of the measured data. The method and system may also include the graphical display of both the expected and measured data to optimize the pressure gradient analysis and the pressure gradient test procedure.