The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Dec. 09, 2003
Bruno DE Man, Clifton Park, NY (US);
Bruno De Man, Clifton Park, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for reducing artifacts in image data generated by a computed tomography system is provided. The artifacts are due to the presence of a high density object in a subject of interest. Initially, measured sinogram data is received from the computed tomography system. The sinogram data is representative of a plurality of sinogram elements. The measured sinogram data is reconstructed to generate initial reconstructed image data. A trace of the high density object is identified in the measured sinogram data. Then a region of interest is identified in the initial reconstructed image data. An optimization criterion is identified based upon the region of interest. The sinogram elements in the trace of the high density object in the measured sinogram data is iteratively adjusted based upon the optimization criterion to generate corrected sinogram data. The corrected sinogram data is reconstructed to generate improved reconstructed image data.