The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2008

Filed:

Apr. 10, 2006
Applicants:

Timothy Wayne Deller, Waukesha, WI (US);

Kelly Lynn Piacsek, Pewaukee, WI (US);

Steven Gerald Kohlmyer, Lynnwood, WA (US);

Inventors:

Timothy Wayne Deller, Waukesha, WI (US);

Kelly Lynn Piacsek, Pewaukee, WI (US);

Steven Gerald Kohlmyer, Lynnwood, WA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes receiving cine scan data, receiving a plurality of target phases of a periodic waveform, and generating a plurality of images, each image centered at one of the received target phases. A phase shall represent a percentage of a period of a repeating cycle.


Find Patent Forward Citations

Deller, Timothy. (2008). Methods and apparatus for 4dct imaging systems (U.S. Patent No. 7443946). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7443946

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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