The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Nov. 10, 2004
Hyung-soo Kim, Suwon-si, KR;
Hyeong-chae Kim, Yongin-si, KR;
Hyung-soo Kim, Suwon-si, KR;
Hyeong-chae Kim, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
An optical scanning unit including: a light source which produces and emits a beam; a beam deflector which deflects and scans the beam in a main scanning direction of an exposed object; and an f-θ lens which corrects the beam deflected by the beam deflector at different magnifications for the main scanning direction than for a subscanning direction so that a corrected beam is focused onto the exposed object. When H is an entire length in the main scanning direction of the beam focused onto the exposed object and L is an axial distance between a reflection face of the beam deflector and the exposed object, the relationship of H and L satisfies an expression