The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Dec. 21, 2005
Richard L. Lopushansky, The Woodlands, TX (US);
Larry A. Jeffers, Minerva, OH (US);
John W. Berthold, Salem, OH (US);
Richard L. Lopushansky, The Woodlands, TX (US);
Larry A. Jeffers, Minerva, OH (US);
John W. Berthold, Salem, OH (US);
Davidson Instruments Inc., The Woodlands, TX (US);
Abstract
A method for monitoring changes in a gap which corresponds to changes in a particular environmental parameter using a tunable laser and interferometer at high frequency is disclosed. The laser light provided to the interferometer is swept through a small range of wavelengths. Light modulated by the interferometer is detected and a non-sinusoidal light intensity output curve is created, a reference point on the curve identified and subsequent sweep of the laser performed. The difference in time, wavelength, or frequency at the occurrence of the reference point between the two sweeps allows for measuring the relative changes in the gap and, as a result, the change in the environmental parameter.