The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2008

Filed:

Dec. 30, 2006
Applicants:

Vikram Santurkar, Fremont, CA (US);

Hyun Yi, Sunnyvale, CA (US);

Inventors:

Vikram Santurkar, Fremont, CA (US);

Hyun Yi, Sunnyvale, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 17/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are provided for calibrating parallel on-chip termination (OCT) impedance circuits. An on-chip termination (OCT) calibration circuit generates first calibration codes and second calibration codes. The first calibration codes control the conductive states of first transistors that are coupled in parallel between a supply voltage and a first terminal. The second calibration codes control the conductive states of second transistors that are coupled in parallel between the first terminal and ground. The OCT calibration circuit selects a first calibration code and a second calibration code and transmits the selected calibration codes to third and fourth transistors to control a parallel on-chip termination impedance at a pin.


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