The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7443075 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 28, 2008

Filed:

May. 26, 2006
Applicant:

Takehiko Sugiura, Kariya, JP;

Inventor:

Takehiko Sugiura, Kariya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An entrapment detecting system includes a detection portion provided at an opening/closing apparatus for detecting an acceleration thereof on the basis of an output from a piezoelectric sensor for outputting a voltage corresponding to the acceleration and a control portion for judging whether or not an object is entrapped by the opening/closing apparatus on the basis of a detected result of the detection portion. The detection portion includes a current control portion connected to the control portion in series as a closed circuit whereby electricity is supplied from the control portion to the current control portion. The current control portion changes a consumed current of the detection portion on the basis of the output from the piezoelectric sensor. The control portion judges whether or not the object is entrapped on the basis of the consumed current of the detection portion changed by the current control portion.


Find Patent Forward Citations

Sugiura, Takehiko. (2008). Entrapment detecting system (U.S. Patent No. 7443075). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7443075

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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