The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Sep. 26, 2007
Joseph K. V. Comeau, Essex Junction, VT (US);
Adele M. Mahoney, Underhill, VT (US);
Jason P. Ritter, Jericho, VT (US);
Gerald J. Scilla, Essex Junction, VT (US);
Charles H. Wilson, Essex Junction, VT (US);
Joseph K. V. Comeau, Essex Junction, VT (US);
Adele M. Mahoney, Underhill, VT (US);
Jason P. Ritter, Jericho, VT (US);
Gerald J. Scilla, Essex Junction, VT (US);
Charles H. Wilson, Essex Junction, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A test environment and an associated method of testing and analyzing a semiconductor package material containing a molding compound, for stability in a sustained oxygen environment. Test samples are exposed to a pressurized gas containing oxygen, under elevated temperature below the glass transition temperature of the molding compound. Control samples are exposed to a pressurized inert gas under similar or more severe conditions of gas pressure, temperature, and humidity. At least one characteristic common to the test samples and the control samples is measured. A determination is made as to whether there exists at least one significant difference between the at least one measured characteristic of the test samples and the control samples.