The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Jan. 14, 2004
Applicants:
Toshikazu Hirota, Owariasahi, JP;
Takao Ohnishi, Nishikasugai-Gun, JP;
Inventors:
Toshikazu Hirota, Owariasahi, JP;
Takao Ohnishi, Nishikasugai-Gun, JP;
Assignee:
NGK Insulators, Ltd., Nagoya-Shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/00 (2006.01); C12M 1/36 (2006.01); C12N 11/16 (2006.01); C07H 21/04 (2006.01); G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
When the genetic analysis is performed by using a DNA microarray, the inspection accuracy is improved. A sample solution is supplied onto a base plate to prepare the DNA microarray comprising a large number of spots based on the sample solution arranged on the base plate. In the microarray, the planar configuration of the spot is substantially circular, and a plurality of spots having different spot sizes are formed on the base plate.