The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Mar. 19, 2004
Alan B. Auerbach, Sammamish, WA (US);
Shawn M. Murphy, Seattle, WA (US);
Walter R Smith, Seattle, WA (US);
Alan B. Auerbach, Sammamish, WA (US);
Shawn M. Murphy, Seattle, WA (US);
Walter R Smith, Seattle, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
The present invention relates it directed to configurable collection of computer related metric data. A computer system generates computer related metric data related to an application. The application accesses a manifest that indicates a portion of the generated computer related metric data (e.g., a subset) is to be packaged for delivery. The application sends schema-based package start data to cause the portion of generated computer related metric data to be packaged. A quality metric module receives the schema-based package start data and accesses the indicated portion of computer related metric data. The quality metric module packages the portion of computer related metric data according to a packaging schema. The application sends a package send command to cause the packaged portion of computer related metric data to be delivered. The quality metric module receives the package send command and sends the packaged portion of computer related metric data in response to the package send command.