The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Feb. 27, 2006
Timothy S. Lehner, Hopewell Junction, NY (US);
Richard D. Kimmel, Wappingers Falls, NY (US);
Ali Sadigh, Irvine, CA (US);
Emrah Acar, Montvale, NJ (US);
Ying Liu, Austin, TX (US);
Ivan L. Wemple, Shelburne, VT (US);
Timothy S. Lehner, Hopewell Junction, NY (US);
Richard D. Kimmel, Wappingers Falls, NY (US);
Ali Sadigh, Irvine, CA (US);
Emrah Acar, Montvale, NJ (US);
Ying Liu, Austin, TX (US);
Ivan L. Wemple, Shelburne, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and a system for validating initial conditions (ICs) generally provided by a user when simulating a VLSI circuit are described. Inconsistent ICs sets are detected and replaced by consistent subsets thereof. The method selects the resistance and source values in a Norton or Thevenin circuit used to enforce the IC, and detects when specified ICs are inconsistent while preserving critical or fragile ICs when a two DC-pass approach is used. It further correlates the set of consistent ICs thus obtained with an equivalent circuit and simultaneously provides an input for future use. This allows a user to be notified and given a measure of how bad the inconsistencies are. Detecting inconsistencies is achieved either by measuring the holding current or by measuring the voltage drift if the two DC-pass approach is used.