The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Dec. 26, 2002
Applicant:
Amar Guettaf, Sunnyvale, CA (US);
Inventor:
Amar Guettaf, Sunnyvale, CA (US);
Assignee:
Broadcom Corporation, Irvine, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus are described for testing at least one critical data path in a design of a digital integrated circuit chip during a simulation of the design. A dedicated memory-bypass-enable signal is provided to a memory-bypass-logic circuit of the design during test modes of the simulation. Data content of a memory circuit within the critical data path is protected, using the dedicated memory-bypass-enable signal, during part of a path-delay test mode of the simulation. The memory circuit is also bypassed using the memory-bypass-enable signal during a memory-bypass test mode of the simulation.