The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Mar. 18, 2005
Mark Mathieu Theodorus Giebels, Berkeley, CA (US);
Daniel Conrad Benson, Berkeley, CA (US);
Mark Mathieu Theodorus Giebels, Berkeley, CA (US);
Daniel Conrad Benson, Berkeley, CA (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method of analyzing a manufacturing system. The manufacturing system includes a plurality of manufacturing resources. A set of orders is currently appointed for processing by the manufacturing system. Each order of the set of orders requires performance of at least one task. Each task is to be performed by at least a respective one of the manufacturing resources. The method includes determining stochastic parameters for each task of the plurality of tasks. The method also includes calculating a stochastic waiting time for at least one selected task of the plurality of tasks. The calculation is based at least in part on the stochastic parameters of the tasks.