The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
May. 12, 2005
Applicants:
Richard Qian, Vancouver, WA (US);
Peter J. L. Van Beek, Vancouver, WA (US);
Inventors:
Richard Qian, Vancouver, WA (US);
Peter J. L. Van Beek, Vancouver, WA (US);
Assignee:
Sharp Laboratories of America, Inc., Camas, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for characterizing an image where a number of test areas of predefined shape and size are located on the image. The color or the texture of the image over each of the test areas is quantified. The image can be characterized by statistical descriptions of the frequency distribution of color or texture of the test areas.