The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Dec. 15, 2003
Jens Von Berg, Hamburg, DE;
Vladimir Pekar, Hamburg, DE;
Michael Kaus, Hamburg, DE;
Olivier Gerard, Viroflay, FR;
Jean-michel Rouet, Paris, FR;
Sherif Makram-ebeid, Dampierre, FR;
Maxim Fradkin, Paris, FR;
Jens Von Berg, Hamburg, DE;
Vladimir Pekar, Hamburg, DE;
Michael Kaus, Hamburg, DE;
Olivier Gerard, Viroflay, FR;
Jean-Michel Rouet, Paris, FR;
Sherif Makram-Ebeid, Dampierre, FR;
Maxim Fradkin, Paris, FR;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method for segmentation of a three-dimensional structure in a three-dimensional data set, especially a medical data set. The method uses a three-dimensional deformable model, wherein the surface of the model consists of a net of polygonal meshes. The meshes are split into groups, and a feature term is assigned to each group. After the model has been placed over the structure of interest, the deformable model is recalculated in consideration of the feature terms of each group.