The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Jan. 31, 2007
Joachim Baumann, München, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Joachim Baumann, München, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method and a measuring arrangement are disclosed for nondestructive analysis of an examination object. In at least one embodiment of the method, x-radiation having a specific energy spectrum is generated by an x-ray source, with the aid of at least one x-ray/optical grating in the beam path of the x-radiation there is generated a standing wave field of this x-radiation that is positioned at least partially in the examination object, and the radiation excited by the x-ray standing wave field in the examination object is measured as a function of at least one relative position between the examination object and the x-ray standing wave field. Further, a material distribution in the examination object is inferred from the measurement result of the radiation excited by the x-ray standing wave field.