The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Feb. 11, 2005
Daniel M. Dreps, Georgetown, TX (US);
Frank D. Ferraiolo, New Windsor, NY (US);
Gary A. Peterson, Rochester, MN (US);
Robert J. Reese, Austin, TX (US);
Daniel M. Dreps, Georgetown, TX (US);
Frank D. Ferraiolo, New Windsor, NY (US);
Gary A. Peterson, Rochester, MN (US);
Robert J. Reese, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for de-skewing and aligning digital data received over an elastic interface bus is disclosed. Upon receiving the data, it is sent through a programmable delay line. While in the programmable delay line, the data is sampled at three points within the data's eye pattern. The three sampling points are dynamically adjusted to maximize coverage of the data's eye pattern. During the adjustment of the sampling points to optimally cover the data's eye pattern, delayed data is sampled from an alternate sampler to prevent sampling from the functional sampler while the delay in the primary sampler is adjusted. Sampling from the alternate sampler while changing the sampling points of the functional sampler serves to reduce glitches that may occur by sampling the functional sampler while its sampling parameters are changed. The method and apparatus allow for alternate eye tracking and wrap around eye tracking.