The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

May. 18, 2006
Applicants:

Mitsuru Uda, Shiga, JP;

Atsushi Kohayase, Kanagawa-Ken, JP;

Hiroshi Yamashita, Kanagawa, JP;

Inventors:

Mitsuru Uda, Shiga, JP;

Atsushi Kohayase, Kanagawa-Ken, JP;

Hiroshi Yamashita, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an apparatus and method for detecting flatness and/or unevenness of a surface of an overcoat layer on a colored pixel layer of a color filter with a high degree of accuracy. The apparatus includes: a light source, placed almost directly above the surface of a plate, for emitting an emission-line spectrum corresponding to at least one color of coloring particles in a color filter; a photo-receiver, placed obliquely upward with respect to the surface of the plateand having a spectral sensitivity corresponding to the emission-line spectrum of the light source, for receiving reflected light from the color filteron the plateduring inspection; and a detection meansfor creating a brightness distribution for a color using a color signal output from the photo-receiveras corresponding to its spectral sensitivity to detect the flatness (unevenness) of the surface of an overcoat layer


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