The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

Sep. 21, 2006
Applicant:

Hiroshi Fujita, Saitama, JP;

Inventor:

Hiroshi Fujita, Saitama, JP;

Assignee:

FUJINON Corporation, Saitama-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A confocal microscope apparatus capable of rapidly obtaining a tomographic image using OCT measuring. The confocal microscope apparatus for obtaining a tomographic image of a measuring object includes a light modulating section that modulates the frequency of the reference light. The light modulating section includes: a diffraction grating element for dispersing the reference light; a collimator lens for collimating the reference light dispersed by the diffraction grating element; and a reflection mirror for reflecting the reference light transmitted through the collimator lens back to the collimator lens and inputting to the diffraction grating element. The reflection mirror is pivoted on a position which is offset from the optical axis of the collimator lens.


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