The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Jan. 23, 2004
Robert Edward Auer, Key Largo, FL (US);
Clarence Lew, Irvine, CA (US);
Stephen Lyle Pentoney, Chino Hills, CA (US);
David Lin Yang, Orange, CA (US);
Robert Edward Auer, Key Largo, FL (US);
Clarence Lew, Irvine, CA (US);
Stephen Lyle Pentoney, Chino Hills, CA (US);
David Lin Yang, Orange, CA (US);
Beckman Coulter, Inc., Fullerton, CA (US);
Abstract
A system for measuring the irradiance of a fluorescently labeled particle having a cytometric flow chamber; a plurality of excitation light sources; a plurality of scatter detectors, each configured to detect light from only one of the plurality of excitation light sources and arranged so as to detect scattered light from the particle; a trigger connected to the plurality of scatter detectors, the trigger emitting a signal when scattered light incident on one of the scatter detectors is exceeding a predetermined threshold value; collection optics; at least one fluorescence detector to receive emissions collected by the collection optics and generate an output, the at least one fluorescence detector being configured to respond only to a discrete number of wavelength bands; and an integrator for recording the output of the at least one fluorescence detector in response to a signal from the trigger.