The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

Feb. 23, 2005
Applicants:

Mark Earl Froggatt, Blacksburg, VA (US);

Brian Joseph Soller, Blacksburg, VA (US);

Inventors:

Mark Earl Froggatt, Blacksburg, VA (US);

Brian Joseph Soller, Blacksburg, VA (US);

Assignee:

Luna Innovations Incorporated, Roanoke, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Complex data is obtained from OFDR backscatter measurements for an optical device under test (DUT). That complex scatter pattern data may be used along with a previously-determined fiber segment pattern to identify the fiber segment within the DUT, even when the DUT is an optical network DUT that includes multiple fibers coupled to perform one or more functions. In other non-limiting example applications, the OFDR scatter pattern data can be used to identify where in the DUT a loss occurred and where in the DUT a temperature change occurred.


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