The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Apr. 26, 2007
Joseph M. Gorin, Santa Rosa, CA (US);
Kenneth D. Poulton, Palo Alto, CA (US);
Joseph M. Gorin, Santa Rosa, CA (US);
Kenneth D. Poulton, Palo Alto, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Staggered interleaved Nyquist regions associated with differing ADC clock rates (F) avoids spectrum lost through disjoint guard bands at the end of or between adjacent Nyquist regions. The staggered interleaved Nyquist regions overlap by an amount at least as much as is consumed by the guard bands. Selectable anti-aliasing filters associated with each Nyquist region and its ADC clock rate are used to enforce the staggered Nyquist regions and their various guard bands. For example, and neglecting guard bands, an initial raw band of operation RBmay be the First Nyquist region for a basic sampling frequency F. An adjacent raw band of operation RBthat overlaps RBmay be the Second Nyquist region for an alternate sampling frequency 2F/3. An adjacent raw band of operation RBthat overlaps RBmay be the Second Nyquist region for the basic sampling frequency F. These raw bands interleave and overlap: In this example the smallest overlap is F/6. We then select widths for guard bands that do not exceed F/6. Additional ADC clock rates and anti-aliasing filters may be used to operate in still higher Nyquist regions.