The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Aug. 31, 2006
Alfio Zanchi, Colorado Springs, CO (US);
Kevin Quynh Nguyen, Plano, TX (US);
Alfio Zanchi, Colorado Springs, CO (US);
Kevin Quynh Nguyen, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method digitally representing an integral non-linearity response for a device includes: (a) In no particular order: (1) Identifying locations of significant departures of the integral response, including: [a] Extracting first and second differential responses from the integral response in first and second device trim states. [b] Twice-filtering first and second differential responses to produce first and second filtered responses. [c] Determining difference between first and second filtered responses to produce a treated response. [d] Identifying a locus for each maximum of the treated response in a highest excursion range and in at least one lower excursion range. [e] Imposing zero amplitude on the treated response within a code range of each locus. Locations are centered within each code range. (2) Determining magnitude for each significant departure. (b) Collecting each location in association with each magnitude for each significant departure to establish an array of location-magnitude pairs effecting the representing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile