The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

Jan. 19, 2007
Applicants:

Alexander Pines, Berkeley, CA (US);

Daniel Topgaard, Hastveda, SE;

Dimitrios Sakellariou, Boulogne Billancourt, FR;

Rachel W. Martin, Irvine, CA (US);

Carlos A. Meriles, Fort Lee, NJ (US);

Inventors:

Alexander Pines, Berkeley, CA (US);

Daniel Topgaard, Hastveda, SE;

Dimitrios Sakellariou, Boulogne Billancourt, FR;

Rachel W. Martin, Irvine, CA (US);

Carlos A. Meriles, Fort Lee, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for compensating for static magnetic field inhomogeneities during nuclear magnetic resonance detection are disclosed. Application of radio frequency pulses and/or magnetic field gradients may be used to correct for spin dephasing caused by the inhomogeneities. The methods and system may be used to improve signal-to-noise ratios in NMR and MRI systems where magnetic field inhomogeneity may have an effect.


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