The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

Jul. 03, 2006
Applicants:

Jianhua Xu, Mill Creek, WA (US);

Frank Blaine Metting, Iii, Bothell, WA (US);

Gregory T. Gibson, Snohomish, WA (US);

Richard A. James, Woodinville, WA (US);

Inventors:

Jianhua Xu, Mill Creek, WA (US);

Frank Blaine Metting, III, Bothell, WA (US);

Gregory T. Gibson, Snohomish, WA (US);

Richard A. James, Woodinville, WA (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); G01B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Aspects of the subject matter described herein relate to reducing error in images obtained from an image-acquiring system. An image-acquiring system may be modeled as light received from a primary path, light received from a secondary path, and light received from all other paths. Light received from the secondary and other paths may cause error in images captured by the image-acquiring system. By compensating for this light, the error may be reduced. Other aspects are described in the specification.


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