The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Aug. 16, 2005
Hisashi Ohtsuka, Kanagawa, JP;
Nobuhiko Ogura, Kanagawa, JP;
Hisashi Ohtsuka, Kanagawa, JP;
Nobuhiko Ogura, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a method for measuring the dissociation rate coefficient (Kd) by surface plasmon resonance analysis without measuring the theoretical maximum amount of binding (Rmax). The present invention provides a method for measuring the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by assaying changes in surface plasmon resonance signals using a surface plasmon resonance measurement device, wherein the signal and the slope of the dissociation curve of the surface plasmon resonance signal curves, or the signal ratio are used to calculate the dissociation rate coefficient (Kd).