The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2008

Filed:

Dec. 22, 2006
Applicants:

Patrick Gentempo, Jr., Oakland, NJ (US);

Lee L Brody, Somerville, MA (US);

Inventors:

Patrick Gentempo, Jr., Oakland, NJ (US);

Lee L Brody, Somerville, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01K 13/00 (2006.01); G01K 3/00 (2006.01); G01J 5/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for recalibrating a bilateral thermal scanner comprising a first thermal sensor and a second thermal sensor can comprise acquiring a first set of thermal scanning data with the thermal sensors in their normal positions; optionally analyzing the first set of thermal scanning data is analyzed to determine if the data has a one-sided bias; acquiring a second set of thermal scanning data with the positions of the thermal sensors reversed; determining a calibration from the first and second sets of thermal scanning data; and optionally correcting at least one of the first and/or second set of thermal scanning data using the calibration.


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