The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Jan. 21, 2005
François Lacombe, Chaville, FR;
David Lafaille, Meudon, FR;
Marie Glanc, Meudon, FR;
Eric Gendron, Meudon, FR;
Douchane Stefanovitch, Meudon, FR;
François Lacombe, Chaville, FR;
David Lafaille, Meudon, FR;
Marie Glanc, Meudon, FR;
Eric Gendron, Meudon, FR;
Douchane Stefanovitch, Meudon, FR;
Centre National de la Recherche Scientifique, Paris, FR;
Observatoire de Paris, Paris, FR;
Mauna Kea Technologies, Paris, FR;
Abstract
A sighting device is provided for an examination of the eye, including at least one moving target with a programmable form and trajectory, the target being displayed on a visualisation unit, such as an appropriate screen and visible from both eyes during the examination. An in-vivo tomographical eye examination system is also provided, including: a Michelson interferometer, generating a full-field OCT image, adaptable optical apparatus, arranged between the interferometer and an eye for examination, achieving the correction of the wavefronts coming from the eye and also the wavefronts going to the eye, detection apparatus, arranged after the interferometer, permitting the interferometric measurement by the OCT principle without modulation nor synchronized detection and a sighting device, with at least one mobile target with a programmable form and trajectory, the target being displayed on an appropriate screen and visible from at least one of the eyes during the examination.