The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
Feb. 07, 2007
Bahadir Tunaboylu, Chandler, AZ (US);
John Mcglory, Chandler, AZ (US);
Horst Clauberg, Warminster, PA (US);
Bruce Griffing, North Wales, PA (US);
Robert E. Werner, Chalfont, PA (US);
Edward T. Laurent, Ambler, PA (US);
Edward L. Malantonio, Conshohocken, PA (US);
Alan Slopey, Warrington, PA (US);
Paul Bereznycky, Medford, NJ (US);
Bahadir Tunaboylu, Chandler, AZ (US);
John McGlory, Chandler, AZ (US);
Horst Clauberg, Warminster, PA (US);
Bruce Griffing, North Wales, PA (US);
Robert E. Werner, Chalfont, PA (US);
Edward T. Laurent, Ambler, PA (US);
Edward L. Malantonio, Conshohocken, PA (US);
Alan Slopey, Warrington, PA (US);
Paul Bereznycky, Medford, NJ (US);
SV Probe Pte Ltd., Singapore, SG;
Abstract
A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.