The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Dec. 30, 2003
Danh Dang, Hayward, CA (US);
Chung Elvis Fu, Sunnyvale, CA (US);
Michael Harms, Pleasanton, CA (US);
Danh Dang, Hayward, CA (US);
Chung Elvis Fu, Sunnyvale, CA (US);
Michael Harms, Pleasanton, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
A set of boundary scan registers are implemented by reconfiguring the functional blocks of a reconfigurable device. This 'soft-wired' set of boundary scan registers can be used to test the interface connections between the IP core and the functional blocks of the reconfigurable device. Additionally, the set of boundary scan registers only exists when a testing configuration is loaded into the reconfigurable device. When testing is complete, the testing configuration is erased and the functional blocks may implement other operations. Thus, the set of boundary scan registers consumes no additional chip area. Furthermore, as the set of boundary scan registers disappears after testing, a functional path enabling normal operation modes is unnecessary. Therefore, manually created functional test data is not needed. Instead, ATPG software can create test data from hardware descriptions of the IP core and the set of boundary scan registers.