The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Feb. 11, 2005
Applicants:
Tom Y. Chang, Fishkill, NY (US);
William V. Huott, Holmes, NY (US);
Thomas J. Knips, Wappinger Falls, NY (US);
Donald W. Plass, Poughkeepsie, NY (US);
Inventors:
Tom Y. Chang, Fishkill, NY (US);
William V. Huott, Holmes, NY (US);
Thomas J. Knips, Wappinger Falls, NY (US);
Donald W. Plass, Poughkeepsie, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Memory array built in self testing utilizing including a simple data history table. The table is used to track failing locations observed during any level of assembly test of processor or logic semiconductor chips where the chips contain SRAM macros with redundant elements for failure relief.