The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Dec. 23, 2003
Jefferson B. Burch, Palo Alto, CA (US);
Glenn R. Engel, S.E. Snohomish, WA (US);
Glen L. Purdy, Jr., S.E. Snohomish, WA (US);
Jefferson B. Burch, Palo Alto, CA (US);
Glenn R. Engel, S.E. Snohomish, WA (US);
Glen L. Purdy, Jr., S.E. Snohomish, WA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A measurement device having a configurable measurement interface that enables the dynamic allocation of responsibilities among front-end and back-end subsystems of a measurement device. A measurement device according to the present teachings includes a front-end subsystem for performing an interaction with a physical environment and back-end subsystem having a set of resources for supporting the front-end subsystem. The front-end and back-end subsystems are coupled to and communicate through a measurement interface. The front-end subsystem transfers a set of bootstrap information via the measurement interface to the back-end subsystem and in response the back-end subsystem configures the resources to support the front-end subsystem.