The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Dec. 17, 2003
Heeren Pathak, Woburn, MA (US);
Seth H. Hitchings, Arlington, MA (US);
Foti Barlos, Winchester, MA (US);
Jefferson M. Kommers, Somerville, MA (US);
John C. Artz, Jr., Woburn, MA (US);
Heeren Pathak, Woburn, MA (US);
Seth H. Hitchings, Arlington, MA (US);
Foti Barlos, Winchester, MA (US);
Jefferson M. Kommers, Somerville, MA (US);
John C. Artz, Jr., Woburn, MA (US);
Vignette Corporation, Austin, TX (US);
Abstract
Systems and methods for collecting and categorizing data and initiating analyses of the data based on the detection of conditions associated with the data. One embodiment is a method including the steps of collecting data from a data source, categorizing or otherwise transforming the data, determining when one or more predetermined conditions relating to the collected data are met, and initiating one or more corresponding analyses of the data upon detection of the predetermined conditions. The detection of the predetermined conditions and the initiation of corresponding analyses can be recursive, in that the results of one analysis can be collected and then re-analyzed, with or without other data. The analyses can be performed cooperatively by multiple devices. The method can be entirely automated in order to improve the efficiency of the analyses.